The Benefits of RF Testing for Mission-Critical IoT Designs


This paper briefly covers several mission-critical IoT applications as well as some common RF test methods for IoT and their respective challenges. Finally, next-generation test solutions are presented along with the “hidden” bottom-line benefits that specific test equipment can provide, namely:

  • Lowering test and measurement costs
  • Shortening the time-to-market (TTM) of IoT products